Identifying a Forgery
Mathieu Riopel, Olivier Tardif-Paradis, Alexandre April
About 1 hour
Related concept(s) :
Energy of a photon, Planck constant, work function
In this problem, the students have to use the data presented in a spectroscopic analysis produced using the X-ray induced photoelectron spectrometry technique (XPS for X-Ray photoelectron spectroscopy) to authenticate an artwork. To conduct the analysis, the students need to understand various concepts related to the photoelectric effect that this spectroscopic technique is based on.